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TRACE DATA ACQUISITION DEVICE, TRACE DATA ACQUISITION METHOD OF TRACE DATA ACQUISITION DEVICE, AND DEBUGGING SYSTEM
TRACE DATA ACQUISITION DEVICE, TRACE DATA ACQUISITION METHOD OF TRACE DATA ACQUISITION DEVICE, AND DEBUGGING SYSTEM
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机译:痕迹数据获取装置,痕迹数据获取装置的痕迹数据获取方法以及调试系统
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摘要
PROBLEM TO BE SOLVED: To efficiently acquire necessary trace data without stopping execution of an LSI nor dividing a program to be tested.SOLUTION: A trace data input/output state analysis part 140 selects types of trace data 101 in the decreasing order of priority based upon free capacity 102 of a trace data buffer 120. A trace data selection part 110 inputs trace data 101 from a trace signal generation source of LSI and determines whether the input trace data 101 is trace data 101 of a selected type. When the trace data 101 is the trace data 101 of the selected type, the trace data selection part 110 stores the trace data 101 in a trace data buffer 120. When the trace data 101 is not the trace data 101 of the selected type, the trace data selection part 110 discards the trace data 101.
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