首页> 外国专利> Device for examination of surface quality of planar samples for investigations on scratch resistance of samples, has test weights designed in mechanically-movable manner to increase load exerted on sample by testing switch

Device for examination of surface quality of planar samples for investigations on scratch resistance of samples, has test weights designed in mechanically-movable manner to increase load exerted on sample by testing switch

机译:用于检查平面样品表面质量以调查样品耐刮擦性的设备,具有以机械移动方式设计的测试砝码,以增加通过测试开关施加在样品上的负载

摘要

The device has a desk comprising a clamping device (5) i.e. spring force clamping lever, for releasably fixing respective samples (24) on the desk and a stop unit (22) for keeping the sample in a defined position. A testing switch is secured at a pivotal arm (12) whose lever end is formed in a weight-loaded manner. Test weights (8) are arranged on a support carriage (11) and designed in a mechanically-movable manner to increase load exerted on the sample by the switch while the sample is moved with respect to the switch by a drive unit.
机译:该设备具有一个桌子,该桌子包括用于将各个样品(24)可释放地固定在桌子上的夹紧设备(5),即弹簧力夹紧杆,以及用于将样品保持在限定位置的止动单元(22)。测试开关固定在枢转臂(12)上,该枢转臂的杠杆端部以重载方式形成。测试配重(8)布置在支撑架(11)上,并且以机械可移动的方式设计成在样品通过驱动单元相对于开关移动时增加由开关施加在样品上的负载。

著录项

  • 公开/公告号DE102010034118A1

    专利类型

  • 公开/公告日2011-12-22

    原文格式PDF

  • 申请/专利权人 PRINTEC GMBH;

    申请/专利号DE20101034118

  • 发明设计人 ANTRAG AUF NICHTNENNUNG;

    申请日2010-08-12

  • 分类号G01N3/56;G01N3/46;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:28

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