首页> 外国专利> Process for rapidly finding the accurate masses of subfragments comprising an unknown compound from the accurate-mass mass spectral data of the unknown compound obtained on a mass spectrometer

Process for rapidly finding the accurate masses of subfragments comprising an unknown compound from the accurate-mass mass spectral data of the unknown compound obtained on a mass spectrometer

机译:从质谱仪上获得的未知化合物的精确质量质谱数据中,快速查找包含未知化合物的亚片段的精确质量的过程

摘要

The invention is a process for finding the accurate masses of subfragments comprising an unknown compound from the accurate-mass mass spectral data of the unknown compound obtained on a mass spectrometer. This process generates these accurate masses of subfragments using mass differences of fragment ions and a listing of plausible masses. In this way, the accurate masses of subfragments, useful for generating modular structures, can be obtained very rapidly.
机译:本发明是一种用于从在质谱仪上获得的未知化合物的精确质量质谱数据中找到包含未知化合物的精确子片段质量的方法。该过程使用碎片离子的质量差异和可能的质量列表生成这些精确的亚片段质量。以这种方式,可以非常快速地获得用于生成模块化结构的精确的亚碎片质量。

著录项

  • 公开/公告号US8344315B2

    专利类型

  • 公开/公告日2013-01-01

    原文格式PDF

  • 申请/专利权人 DANIEL LEO SWEENEY;

    申请/专利号US20100802021

  • 发明设计人 DANIEL LEO SWEENEY;

    申请日2010-05-27

  • 分类号H01J49/26;

  • 国家 US

  • 入库时间 2022-08-21 16:43:21

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