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GaAsSb layer with graded composition reducing stress in InAs/GaAs quantum dots

机译:具有梯度成分的GaAsSb层可降低InAs / GaAs量子点中的应力

摘要

The multilayer semiconductor epitaxial structure of InAs / GaAs quantum dots and GaAsSb cover and the stress-reducing layer of sparing type heterojunction between InAs quantum dots and GaAsSb layer and permitting issuance of electroluminescence at telecommunication wavelength of 1300 nm. Maintaining heterojunction type I for these wavelengths is achieved gradovaným composition GaAs.sub.1-xnSb.sub.xnvrstvy so that the GaAsSb layer being lower concentration of Sb (x = .03 to .09) immediately adjacent the quantum dots, (thereby securing a sufficient barrier for holes in InAs quantum dots and their localization in quantum dots) in the direction of epitaxial growth the concentration of antimony in the GaAsSb rise to the maximum concentration which is in the range x = 0.15-0.30. (This provides a necessary lowering of tensions within the quantum dot and an extension of the emitted wavelengths). The structure can be realized with the continuous changes of the concentration of antimony or stepwise by using two or more layers.
机译:InAs / GaAs量子点和GaAsSb的多层半导体外延结构以及InAs量子点和GaAsSb层之间的稀疏型异质结的应力减小层,并允许在1300 nm的电信波长下发出电致发光。实现了在这些波长下保持异质结类型I的目的,即组成GaAs.sub.1-xnSb.xnvrstvy,从而使GaAsSb层的Sb浓度较低(x = .03至.09),紧邻量子点(从而确保在InAs量子点中的空穴及其在量子点中的局部外延生长方向上的足够的阻挡层中,GaAsSb中锑的浓度上升到最大浓度,该最大浓度在x = 0.15-0.30的范围内。 (这提供了量子点内张力的必要降低和发射波长的扩展)。通过使用两层或更多层,锑浓度的连续变化或逐步变化,可以实现该结构。

著录项

  • 公开/公告号CZ2011570A3

    专利类型

  • 公开/公告日2013-05-29

    原文格式PDF

  • 申请/专利权人 FYZIKALNI ·STAV AV CR V.V.I.;

    申请/专利号CZ2011570

  • 发明设计人 HOSPODKOVA ALICE;PANGRAC JIRI;OSWALD JIRI;

    申请日2011-09-14

  • 分类号B82Y20;H01L31/0304;H01L31/0352;H01L31/0693;H01L31/102;H01S5/34;

  • 国家 CZ

  • 入库时间 2022-08-21 16:42:02

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