首页> 外国专利> METHOD FOR PRODUCING THIN LEAD-FREE PEROVSKITE SODIUM BISMUTH TITANATE (NABITIO) FILMS WITH HIGH DIELECTRIC PROPERTIES

METHOD FOR PRODUCING THIN LEAD-FREE PEROVSKITE SODIUM BISMUTH TITANATE (NABITIO) FILMS WITH HIGH DIELECTRIC PROPERTIES

机译:具有高介电性能的无铅薄钙钛矿钛酸铋钠(NABITIO)薄膜的制备方法

摘要

The invention relates to a process for producing thin lead-free perovskite sodium bismuth titanate NaBiTiO, (abbreviated NBT ) films with morphological, structural, optical and dielectrical characteristics compatible with the low frequency electronic applications based on the silicon technology, by using the pulsed laser deposition technique. According to the invention, the process consists in depositing thin sodium bismuth titanate, NaBiTiO, films onto a silicon target substrate metallized with a layer of platinum with a thickness of 100 nm by using the pulsed laser technique, wherefrom there results a coating of NBT/Pt/Si with a total thickness of 417.272 ± 3.57 nm, having a value of the forbidden band-width of 3.8 ± 0.05 eV, the values of the dielectric losses lower than 0.05 and the values of the dielectric permittivity of 1450 at 10 kHz.
机译:本发明涉及一种利用脉冲激光生产具有与硅技术为基础的低频电子应用兼容的形态,结构,光学和介电特性的薄形无铅钙钛矿钛酸铋铋酸钠NaBiTiO(简称NBT)薄膜的方法。沉积技术。根据本发明,该方法包括通过使用脉冲激光技术在钛金属化的硅靶基板上沉积钛酸铋钠NaBiTiO薄膜,该靶层镀有厚度为100 nm的铂,从而得到NBT / Pt / Si的总厚度为417.272±3.57 nm,禁止带宽的值为3.8±0.05 eV,在10 kHz时的介电损耗值低于0.05,介电常数为1450。

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