POLARIZATION-SENSITIVE PLASMON-POLARITON PHOTO-DETECTOR BASED ON SCHOTTKY BARRIER

摘要

A polarization-sensitive plasmon-polariton photo-detector based on Schottky barrier relates to the development of optoelectronic solid body devices operation of which is based on the methods of spectroscopy of surface plasmon polaritons (SPP), in particular to plasmon-polariton photo-detectors for high-precision and effective analysis of state of light polarization and physical and chemical properties of different substances. Such devices can be used in industry, medicine, power engineering and for non-destructive control of state of environment. The polarization-sensitive plasmon-polariton photo-detector based on Schottky barrier comprises a surface-barrier heterostructure, in particular a semiconductor sub-layer to which layer of metal is applied, with periodic-profiled interface metal/air as diffraction grating and is characterized in that the semiconductor sublayer is flat, and for formation of periodic shaped relief at the metal/air interface a multi-layer structure on basis of layer of metal and nano-wires of chalcogenide semiconductor is used, this has anti-correlated relief, when the profiles of the interface metal/semiconductor and metal/air have different forms, and its thickness is a periodic function of planar coordinate with period equal to the period of diffraction grating. By means of the photo-detector developed for visible spectral range (0.5-0.8 m) increase of its sensitivity is achieved at retention to simplicity of design, small overall dimensions and low material and power expenses, it combines in one element excitation of SPP and registration of the output signal as well.