Method for controlling different models of electronic logic circuit, involves measuring and collecting test step between test points of time durations for circuit models based on measured period of time difference between circuit model

摘要

The method involves providing circuit models (M1,M2) of the logic circuit. The circuit models of identical test area (TB) is defined, and test sequence (TE1,TE2) is connected to the test steps through test points (1). The circuit models of the logic circuit in the test area of the test sequence are subjected. The test step between the test points of time durations for the individual circuit models is measured and collected (3,4) based on the measured periods of time differences between the circuit models.