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APPARATUS AND METHOD FOR PROCESSING THE SIGNAL IN MASTER SLAVE INTERFEROMETRY AND APPARATUS AND METHOD FOR MASTER SLAVE OPTICAL COHERENCE TOMOGRAPHY WITH ANY NUMBER OF SAMPLED DEPTHS
APPARATUS AND METHOD FOR PROCESSING THE SIGNAL IN MASTER SLAVE INTERFEROMETRY AND APPARATUS AND METHOD FOR MASTER SLAVE OPTICAL COHERENCE TOMOGRAPHY WITH ANY NUMBER OF SAMPLED DEPTHS
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机译：主从干涉测量中信号处理的装置和方法以及具有任意数量采样深度的主从光学相干断层扫描的设备和方法
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摘要
The present invention related to an apparatus and method for master slave interferometry, referred to as Complex Master Slave (CMS). The method and apparatus can be used to provide complex-valued measurements of a signal reflected from an axial position inside an object or of signals reflected from points at several axial positions inside an object.
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