首页> 外国专利> THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT METHOD WHICH ARE FOR NON-CONTACT THREE-DIMENSIONAL MEASURING INSTRUMENT

THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL INTEGRATED OPTICAL MEASUREMENT METHOD WHICH ARE FOR NON-CONTACT THREE-DIMENSIONAL MEASURING INSTRUMENT

机译:适用于非接触式三维测量仪器的三维综合光学测量系统和三维综合光学测量方法

摘要

The present invention relates to an integrated optical measurement system and a three-dimensional integrated optical measurement method which are for a non-contact three-dimensional measuring instrument and, more particularly, to a method for constructing, into an integrated system, an image measuring unit, a pointer laser measuring unit, a line laser measuring unit and a WSI measuring unit, and performing three-dimensional measurement therethrough. According to the present invention, heights can be measured in correspondence to various shapes and sizes, the height of a small photographed object can be precisely measured, and since the time required to obtain a height value with a small error range can be shortened, the time for obtaining three-dimensional measurement data from the photographed object can be significantly reduced.
机译:本发明涉及一种用于非接触式三维测量仪器的集成光学测量系统和三维集成光学测量方法,更具体地,涉及一种将图像测量结构构建到集成系统中的方法。单元,指示器激光测量单元,线形激光测量单元和WSI测量单元,并通过它们进行三维测量。根据本发明,可以根据各种形状和大小来测量高度,可以精确地测量小的被摄体的高度,并且由于可以缩短获得误差范围小的高度值所需的时间,因此从被摄体获得三维测量数据的时间可以大大减少。

著录项

  • 公开/公告号WO2019045152A1

    专利类型

  • 公开/公告日2019-03-07

    原文格式PDF

  • 申请/专利权人 BSTECH;

    申请/专利号WO2017KR09619

  • 发明设计人 OH CHANG HWAN;

    申请日2017-09-01

  • 分类号G01B11/24;G01B9/02;G02B27/10;H04N5/225;

  • 国家 WO

  • 入库时间 2022-08-21 11:56:08

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