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Fill-factor improvement of Si CMOS single-photon avalanche diode detector arrays by integration of diffractive microlens arrays

机译:通过集成衍射微透镜阵列改善Si CMOS单光子雪崩二极管探测器阵列的填充因子

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摘要

Single-photon avalanche diode (SPAD) detector arrays generallyudsuffer from having a low fill-factor, in which the photo-sensitive area ofudeach pixel is small compared to the overall area of the pixel. This paperuddescribes the integration of different configurations of high efficiencyuddiffractive optical microlens arrays onto a 32 × 32 SPAD array, fabricatedudusing a 0.35 μm CMOS technology process. The characterization of SPADudarrays with integrated microlens arrays is reported over the spectral range ofud500-900 nm, and a range of f-numbers from f/2 to f/22. We report anudaverage concentration factor of 15 measured for the entire SPAD array withudintegrated microlens array. The integrated SPAD and microlens arrayuddemonstrated a very high uniformity in overall efficiency.
机译:单光子雪崩二极管(SPAD)检测器阵列通常具有较低的填充系数,因此其中每个像素的光敏面积比像素的总面积小。本文描述了将高效/非衍射光学微透镜阵列的不同配置集成到32×32 SPAD阵列上的情况,该阵列是使用0.35μmCMOS技术工艺制造的。在 ud500-900 nm的光谱范围内,以及从f / 2到f / 22的f值范围内,都报告了带有集成微透镜阵列的SPAD udarray的表征。我们报告了带有集成微透镜阵列的整个SPAD阵列测得的平均浓度系数为15。集成的SPAD和微透镜阵列证明了整体效率非常高。

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