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Using Efficient Path Profiling to Optimize Memory Consumption of On-Chip Debugging for High-Level Synthesis

机译:使用有效的路径分析来优化用于高级综合的片上调试的内存消耗

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摘要

High-Level Synthesis (HLS) for FPGAs is attracting popularity and is increasingly used to handle complex systems with multiple integrated components. To increase performance and efficiency, HLS flows now adopt several advanced optimization techniques. Aggressive optimizations and system level integration can cause the introduction of bugs that are only observable on-chip. Debugging support for circuits generated with HLS is receiving a considerable attention. Among the data that can be collected on chip for debugging, one of the most important is the state of the Finite State Machines (FSM) controlling the components of the circuit.udHowever, this usually requires a large amount of memory to trace the behavior during the execution. This work proposes an approach that takes advantage of the HLS information and of the structure of the FSM to compress control flow traces and to integrate optimized components for on-chip debugging. The generated checkers analyze the FSM execution on-fly, automatically notifying when a bug is detected, localizing it and providing data about its cause. The traces are compressed using a software profiling technique, called Efficient Path Profiling (EPP), adapted for the debugging of hardware accelerators generated with HLS. With this technique, the size of the memory used to store control flow traces can be reduced up to 2 orders of magnitude, compared to state-of-the-art.
机译:FPGA的高级综合(HLS)受到欢迎,并且越来越多地用于处理具有多个集成组件的复杂系统。为了提高性能和效率,HLS流现在采用了几种高级优化技术。激进的优化和系统级集成可能导致引入只能在片上观察到的错误。对使用HLS生成的电路的调试支持引起了极大的关注。在可以收集到的芯片上进行调试的数据中,最重要的数据之一就是控制电路组件的有限状态机(FSM)的状态。 ud但是,这通常需要大量的内存来跟踪行为。在执行过程中。这项工作提出了一种利用HLS信息和FSM结构来压缩控制流轨迹并集成优化组件以进行片上调试的方法。生成的检查器会即时分析FSM执行,自动通知何时检测到错误,将其本地化并提供有关其原因的数据。使用称为有效路径概要分析(EPP)的软件概要分析技术压缩跟踪,该技术适用于调试由HLS生成的硬件加速器。与最新技术相比,使用这种技术可以将用于存储控制流迹线的存储器的大小减小多达2个数量级。

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