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机译:
Univ Penn, Dept Chem Engn, Philadelphia, PA 19104, USA, .;
Czochralski silicon; Point defects; Microdefects; Osf-ring; Voids; Defect engineering; Gate oxide integrity; Grown-in defects; Axial temperature-gradient; Dynamic global simulation; Intrinsic point-defects; Heat-transfer; Swirl defects; Computer-simulation; Stacking-faults; Microdefect formation;