A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry

摘要

A scanning probe microscope is combined with a time-of-flight mass spectrometer that analyzes material from the tip of the probe microscope. Chemical analysis on the nanometer scale is achieved by transferring material from surfaces via the probing tip to the mass spectrometer under ultrahigh vacuum conditions. Fast switching between scanning probe and mass analysis operation is implemented by means of a motorized rotatable probe holder. Electrochemically etched tungsten tips are used as probes for the experiments. Thorough characterization of the tips by means of field-emission measurements is crucial for successful experiments. Quartz tuning forks have been applied as force sensors in force microscopy experiments. (c) 2005 American Institute of Physics.