A method for the determination of the noise parameters in preamplifying systems for semiconductor radiation detectors

摘要

In this paper a method for disentangling the various noise components in semiconductor radiation detectorndash;amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/fseries noise, andfparallel noise can be quickly obtained through a multiparameter leasthyphen;squares interpolation of the equivalent noise charge data of the system.