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首页> 外文期刊>review of scientific instruments >Method of characterization of dielectric or semiconductor materials using an optically pumped far infrared waveguide laser
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Method of characterization of dielectric or semiconductor materials using an optically pumped far infrared waveguide laser

机译:Method of characterization of dielectric or semiconductor materials using an optically pumped far infrared waveguide laser

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摘要

A method of measurement of the absorption coefficient of a material is presented using a CO2optically pumped far infrared waveguide laser which has been specially developed for this purpose. This method permits the elimination of the instability effects due to the basic design concept of the laser. It is used to measure the absorption coefficient of a few mesogeneous substances in order to deduce their order parameters.

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