An improved lowhyphen;energy electron diffraction (LEED) system using a twohyphen;dimensional positionhyphen;sensitive detector is described. The system is capable of storing LEED patterns at a resolution of 256times;256 channels with up to 216counts per channel. The maximum electron count rate is 100 kHz. A new position computer with edgehyphen;gating controls and a special eventhyphen;counting memory interfaced to a personal computer is used to record the LEED intensities.
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