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机译:Edge and Interface Resistances Create Distinct Trade-Offs When Optimizing the Microstructure of Printed van der Waals Thin-Film Transistors
Northwestern Univ;
printed electronics; thin-film transistors; 2D materials; transition metal dichalcogenides; Kelvin probe force microscopy; finite element simulation; resistor network model; EXFOLIATION; FABRICATION; GRAPHENE; PHOTOLUMINESCENCE; TECHNOLOGY; TRANSPORT;