A Single-Trim Frequency Reference Achieving ±120 ppm Accuracy From ?50 °C to 170 °C

摘要

A single-trim, highly accurate Colpitts-based frequency reference is presented. Our analysis shows that the Colpitts-topology outperforms the cross-coupled italicLC/italic-topology in terms of temperature stability. Measurements on prototypes in a 0.13-inline-formula tex-math notation="LaTeX"$mu text{m}$ /tex-math/inline-formula high-voltage CMOS silicon on insulator (SOI) process were carried out from ?50 °C to 170 °C. Based on sample-specific single room temperature trim and batch calibration, our frequency reference achieves an accuracy of ±120 ppm for 16 samples from a single wafer utilized for extracting the batch-calibration polynomial and ±300 ppm for 48 samples across three wafers from the same batch. This is a 4inline-formula tex-math notation="LaTeX"$times $ /tex-math/inline-formula improvement over related single-trim state-of-the-art solutions. Frequency drift due to aging, tested after a six-day 175 °C storage, is below 100 ppm. The oscillator core dissipates 3.5 mW from a 2.5-V supply and has 220-ppm/V supply sensitivity without supply regulation.