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首页> 外文期刊>Applied optics >Phase unwrapping for dual-beam electronic speckle pattern interferometry: Method
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Phase unwrapping for dual-beam electronic speckle pattern interferometry: Method

机译:双光束电子散斑图案干涉测量的相位展开:方法

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摘要

A new algorithm to reveal the order and sign of fringes formed by dual-beam electronic speckle-pattern interferometry is described. When combined with a previously reported phase-extraction method, it makes possible the evaluation of displacement absolutely and continuously over the entire surface of the object from a total of five frames. This technique is particularly useful when displacement is spatially discontinuous and temporally fast and the amount of data is large. A model experiment showing the validity of this method is presented. (C) 1997 Optical Society of America
机译:描述了一种揭示双光束电子散斑图案干涉术形成的条纹的顺序和符号的新算法。当与先前报道的相位提取方法结合使用时,可以从总共五个帧中绝对连续地评估对象整个表面上的位移。当位移在空间上不连续且在时间上快速且数据量很大时,此技术特别有用。模型实验表明了该方法的有效性。 (C)1997年美国眼镜学会

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