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首页> 外文期刊>Nanotechnology >Time dependence of negative and positive photoconductivity for Si delta-doped AlGaAs/InGaAs/AlGaAs quantum well under various temperatures and various incident photon energies and intensities
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Time dependence of negative and positive photoconductivity for Si delta-doped AlGaAs/InGaAs/AlGaAs quantum well under various temperatures and various incident photon energies and intensities

机译:在各种温度和各种温度和各种事件光子能量和强度下,Si Delta-掺杂的Algaas / Ingaas / Algaas量子的负性和正光电导性的时间依赖性

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摘要

Si delta-doped AlGaAs/InGaAs/AlGaAs quantum well (QW) structure is commonly adopted as one of the core elements in modern electric and optoelectronic devices. Here, the time dependent photoconductivity spectra along the active InGaAs QW channel in a dual and symmetric Si delta-doped AlGaAs/InGaAs/AlGaAs QW structure are systematically studied under various temperatures (T = 80-300 K) and various incident photon energies (E-in = 1.10-1.88 eV) and intensities. In addition to positive photoconductivity, negative photoconductivity (NPC) was observed and attributed to two origins. For T = 180-240 K with E-in = 1.51-1.61 eV, the trapping of the photo-excited electrons by the interface states located inside the conduction band of InGaAs QW layer is one of the origins for NPC curves. For T = 80-120 K with E-in = 1.10-1.63 eV, the photoexcitation of the excess 'supersaturated' electrons within the active InGaAs QW caused by the short cooling process is another origin.
机译:Siδ掺杂AlGaAs/InGaAs/AlGaAs量子阱(QW)结构是现代光电器件的核心元件之一。本文系统地研究了在不同温度(T=80-300K)和不同入射光子能量(E-in=1.10-1.88eV)和强度下,双对称掺硅AlGaAs/InGaAs/AlGaAs量子阱结构中沿有源InGaAs量子阱通道的随时间变化的光电导谱。除了正的光电导性,还观察到负的光电导性(NPC),并将其归因于两个来源。当T=180-240 K,E-in=1.51-1.61 eV时,InGaAs量子阱层导带内的界面态对光激发电子的俘获是NPC曲线的起源之一。对于T=80-120 K,E-in=1.10-1.63 eV,由短冷却过程引起的激活InGaAs量子阱中过量“过饱和”电子的光激发是另一个原因。

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