...
首页> 外文期刊>Applied optics >Verification of phase measurement error sources in phase-shifting interferometry with four step phase-shifting algorithms
【24h】

Verification of phase measurement error sources in phase-shifting interferometry with four step phase-shifting algorithms

机译:具有四步相移算法的相移干涉测量中相位测量误差源的验证

获取原文
获取原文并翻译 | 示例
           

摘要

The phase-shifting technique is one of the most important techniques in interferometry. The measurement accuracy of this technique is affected by several kinds of systematic and random errors like miscalibration, nonlinear response and tilt shift of the phase shifter, nonlinear recording, speckles, fringe fluctuation, etc. In this paper, a method for verification of all of these phase measurement error sources is proposed by introducing a grayscale image. This image is composed from the lattice-site representation determined by a four step phase-shifting algorithm, which represents the distribution of phase-shift angle values. The shape of the grayscale image is definitely more expressive and demonstrative for the kinds of measurement error sources than the black dot distribution in lattice-site representation. So, with this technique, we can recognize the existence of various measurement error sources and roughly estimate their magnitudes before proceeding with experiments. Our method is to be rather qualitative than quantitative. The availability of this method is discussed in a phase-shifting Fizeau interferometer and a fringe projection profilometry. This method is useful in all kinds of interferometric measurements based on the phase-shifting technique. (C) 2021 Optical Society of America
机译:相移技术是干涉测量中最重要的技术之一。该技术的测量精度受多种系统误差和随机误差的影响,如误校准、移相器的非线性响应和倾斜位移、非线性记录、散斑、条纹起伏等。本文通过引入灰度图像,提出了一种验证所有这些相位测量误差源的方法。该图像由四步相移算法确定的晶格位置表示组成,该算法表示相移角值的分布。对于各种测量误差源,灰度图像的形状肯定比晶格位置表示中的黑点分布更具表现力和说明性。因此,通过这种技术,我们可以识别各种测量误差源的存在,并在进行实验之前粗略估计它们的大小。我们的方法是定性的,而不是定量的。在相移菲索干涉仪和条纹投影轮廓术中讨论了该方法的有效性。该方法适用于基于相移技术的各种干涉测量。(2021)美国光学学会

著录项

  • 来源
    《Applied optics》 |2021年第13期|共9页
  • 作者单位

    Kim II Sung Univ Fac Phys Inst Optoelect Taesong Dist Pyongyang South Korea;

    Kim II Sung Univ Fac Phys Inst Optoelect Taesong Dist Pyongyang South Korea;

    Kim II Sung Univ Fac Phys Inst Optoelect Taesong Dist Pyongyang South Korea;

    Kim II Sung Univ Fac Phys Inst Optoelect Taesong Dist Pyongyang South Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号