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首页> 外文期刊>Applied optics >Solution-processed WS2 and its doping in PEDOT:PSS for tailoring hole injection in near ultraviolet organic light-emitting diodes
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Solution-processed WS2 and its doping in PEDOT:PSS for tailoring hole injection in near ultraviolet organic light-emitting diodes

机译:解决方案加工的WS2及其在PEDOT中的掺杂:PSS用于近紫外线有机发光二极管剪裁空穴注入

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摘要

Solution-processed ethanol tungsten disulfide and its doping in poly(3,4-ethylenedioxythiophene):poly (styrenesulfonate) (PEDOT:PSS + WS2) for tailoring hole injection in near ultraviolet organic light-emitting diodes (NUV OLEDs) are investigated in detail. Raman spectrum, scanning electron microscopy, atomic force microscopy, x-ray/ultraviolet photoelectron spectroscopy, and impedance spectroscopy measurements show that WS2 and its composites have superior film morphology and exceptional electronic properties. Using 2-(4-biphenyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole as the emitter and PEDOT:PSS + WS2 as the hole injection layer, the NUV OLED produces short-wavelength emission peaking at 404 nm and full-width at half-maximum of 53 nm. The device also gives maximum radiance of 4.7 mW/cm(2) and external quantum efficiency of 2.1%, which are superior to counterparts using WS2, UV-ozone-treated WS2, and PEDOT:PSS. The hole injection ability is enhanced by using WS2, UV-ozone-treated WS2, PEDOT:PSS, and PEDOT:PSS + WS2 in this order. The robust hole injection contributes to carrier balance and accounts for high device performance of the fabricated NUV OLEDs. Our results pave an alternative approach for advancing OLEDs and accelerating WS2 applications. (C) 2021 Optical Society of America
机译:详细研究了用于近紫外有机发光二极管(NUV OLED)小孔注入的溶液处理乙醇-二硫化钨及其在聚(3,4-亚乙基二氧噻吩):聚苯乙烯磺酸盐(PEDOT:PSS+WS2)中的掺杂。拉曼光谱、扫描电子显微镜、原子力显微镜、x射线/紫外光电子能谱和阻抗谱测量表明,WS2及其复合材料具有优异的薄膜形貌和优异的电子性能。使用2-(4-联苯)-5-(4-叔丁基苯基)-1,3,4-恶二唑作为发射极,PEDOT:PSS+WS2作为空穴注入层,NUV OLED在404nm处产生短波发射峰值,在53nm处产生全宽。该设备的最大辐射率为4.7 mW/cm(2),外部量子效率为2.1%,优于使用WS2、经紫外线臭氧处理的WS2和PEDOT:PSS的设备。按此顺序使用WS2、UV臭氧处理的WS2、PEDOT:PSS和PEDOT:PSS+WS2可增强空穴注入能力。坚固的空穴注入有助于载流子平衡,并解释了所制造的NUV OLED的高器件性能。我们的研究结果为推进OLED和加速WS2应用提供了另一种途径。(2021)美国光学学会

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  • 来源
    《Applied optics》 |2021年第9期|共6页
  • 作者单位

    Univ Elect Sci &

    Technol China Zhongshan Inst Zhongshan Branch State Key Lab Elect Thin Films &

    Integrated Devic Zhongshan 528402 Peoples R China;

    Guilin Univ Elect Technol Sch Mat Sci &

    Engn Guilin 541004 Peoples R China;

    Guilin Univ Elect Technol Sch Mat Sci &

    Engn Guilin 541004 Peoples R China;

    Univ Elect Sci &

    Technol China Zhongshan Inst Zhongshan Branch State Key Lab Elect Thin Films &

    Integrated Devic Zhongshan 528402 Peoples R China;

    Univ Elect Sci &

    Technol China Zhongshan Inst Zhongshan Branch State Key Lab Elect Thin Films &

    Integrated Devic Zhongshan 528402 Peoples R China;

    China Nonferrous Met Guilin Geol &

    Min Co Ltd Guilin Key Lab Microelect Electrode Mat &

    Biol Na Guilin 541004 Peoples R China;

    China Nonferrous Met Guilin Geol &

    Min Co Ltd Guilin Key Lab Microelect Electrode Mat &

    Biol Na Guilin 541004 Peoples R China;

    Wuhan Inst Technol Hubei Key Lab Plasma Chem &

    Adv Mat Wuhan 430205 Peoples R China;

    Guilin Univ Elect Technol Sch Mat Sci &

    Engn Guilin 541004 Peoples R China;

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