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Controlled carrier mean free path for the enhanced efficiency of III-nitride deep-ultraviolet light-emitting diodes

机译:受控载体是指III-氮化物深紫外发光二极管的增强效率的自由路径

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摘要

Electron overflowfromthe active region confines the AlGaNdeep-ultraviolet (UV) light-emitting diode (LED) performance. This paper proposes a novel approach to mitigate the electron leakage problem in AlGaN deep-UV LEDs using concave quantum barrier (QB) structures. The proposed QBs suppress the electron leakage by significantly reducing the electron mean free path that improves the electron capturing capability in the active region. Overall, such an engineered structure also enhances the hole injection into the active region, thereby enhancing the radiative recombination in the quantum wells. As a result, our study shows that the proposed structure exhibits an optical power of 9.16mWat similar to 284 nm wavelength, which is boosted by similar to 40.5% compared to conventional AlGaNUV LEDoperating at 60mAinjection current. (C) 2021 Optical Society of America
机译:电子从有源区溢出限制了AlGaNdeep紫外(UV)发光二极管(LED)的性能。本文提出了一种利用凹面量子势垒(QB)结构缓解AlGaN深紫外LED中电子泄漏问题的新方法。所提出的量子阱通过显著降低电子平均自由程来抑制电子泄漏,从而提高有源区的电子捕获能力。总的来说,这种工程结构还增强了空穴注入到有源区的能力,从而增强了量子阱中的辐射复合。因此,我们的研究表明,该结构的光功率为9.16mWat,与284nm波长的光功率相似,与在60mA注入电流下运行的传统AlGaNUV LED相比,其光功率提高了约40.5%。(2021)美国光学学会

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  • 来源
    《Applied optics》 |2021年第11期|共6页
  • 作者单位

    New Jersey Inst Technol Dept Elect &

    Comp Engn 323 Dr Martin Luther King Jr Blvd Newark NJ 07102 USA;

    New Jersey Inst Technol Dept Elect &

    Comp Engn 323 Dr Martin Luther King Jr Blvd Newark NJ 07102 USA;

    New Jersey Inst Technol Dept Elect &

    Comp Engn 323 Dr Martin Luther King Jr Blvd Newark NJ 07102 USA;

    New Jersey Inst Technol Dept Elect &

    Comp Engn 323 Dr Martin Luther King Jr Blvd Newark NJ 07102 USA;

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  • 正文语种 eng
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