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Structural Insights on Microwave-Synthesized Antimony-Doped Germanium Nanocrystals

机译:微波合成锑掺杂锗纳米晶体的结构见解

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Doped and alloyed germanium nanocrystals (Ge NCs) are potential candidates for a variety of applications such as photovoltaics and near IR detectors. Recently, bismuth (Bi) as an n-type group 15 element was shown to be successfully and kinetically doped into Ge NCs through a microwave-assisted solution-based synthesis, although Bi is thermodynamically insoluble in bulk crystalline Ge. To expand the composition manipulation of Ge NCs, another more common n-type group 15 element for semiconductors, antimony (Sb), is investigated. Oleylamine (OAm)- and OAm/trioctylphosphine (TOP)-capped Sb-doped Ge NCs have been synthesized by the microwave-assisted solution reaction of GeI2 with SbI3. Passivating the Ge surface with a binary ligand system of OAm/ TOP results in formation of consistently larger NCs compared to OAm alone. The TOP coordination on the Ge surface is confirmed by P-31 NMR and SEM-EDS. The lattice parameter of Ge NCs increases with increasing Sb concentration (0.00-2.0 mol %), consistent with incorporation of Sb. An increase in the NC diameter with higher content of SbI3 in the reaction is shown by TEM. XPS and EDS confirm the presence of Sb before and after removal of surface ligands with hydrazine and recapping the Ge NC surface with dodecanethiol (DDT). EXAFS analysis suggests that Sb resides within the NCs on highly distorted sites next to a Ge vacancy as well as on the crystallite surface. High Urbach energies obtained from photothermal deflection spectroscopy (PDS) of the films prepared from pristine Ge NC and Sb-doped Ge NCs indicate high levels of disorder, in agreement with EXAFS data. Electrical measurements on TiO2-NC electron- and hole-only devices show an increase in hole conduction, suggesting that the Sb-vacancy defects are behaving as a p-type dopant in the Ge NCs, consistent with the vacancy model derived from the EXAFS results.
机译:掺杂和合金化锗纳米晶体(Ge-NCs)是光伏和近红外探测器等多种应用的潜在候选材料。最近,虽然铋在热力学上不溶于大块晶体锗,但通过微波辅助溶液合成,铋(Bi)作为n型15族元素被成功地动力学掺杂到Ge NCs中。为了扩展Ge NCs的成分操纵,研究了另一种更常见的半导体n型15族元素锑(Sb)。通过微波辅助GeI2与SbI3的溶液反应,合成了油酸胺(OAm)和OAm/三辛基膦(TOP)封端的掺Sb Ge NCs。用OAm/TOP二元配体体系钝化锗表面,与单独使用OAm相比,可形成一致较大的NCs。P-31 NMR和SEM-EDS证实了Ge表面的顶配位。Ge NCs的晶格参数随着Sb浓度(0.00-2.0 mol%)的增加而增加,这与Sb的掺入一致。TEM显示,随着反应中SbI3含量的增加,NC直径增大。XPS和EDS证实了在用联氨去除表面配体并用十二硫醇(DDT)重新捕获Ge-NC表面之前和之后Sb的存在。EXAFS分析表明,Sb存在于靠近Ge空位的高度扭曲位置以及微晶表面的NCs中。从原始Ge-NC和掺Sb的Ge-NC制备的薄膜的光热偏转光谱(PDS)获得的高Urbach能量表明无序程度较高,与EXAFS数据一致。TiO2 NC纯电子和纯空穴器件的电学测量显示空穴导电性增加,表明Sb空位缺陷在Ge NCs中表现为p型掺杂剂,这与EXAFS结果得出的空位模型一致。

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