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Transparent surface orientation from polarization imaging using vector operation

机译:从偏振成像使用矢量操作透明表面取向

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摘要

The existing methods for shape measurement using polarization of transparent objects are based on two assumptions: (1) the paraxial assumption, assuming that the reflected ray is parallel to the optical axis of the imaging system; and (2) the s-component approximation assumption, which assumes that the s-component of the reflected light is predominant and the p-component is neglected. To overcome limitations posed by these two assumptions, this paper proposes a method based on the polarization characteristics of reflection from a transparent surface and vector operation. To overcome the paraxial assumption, the normal vector of the transparent surface is deduced by vector operation, analyzing the relationships between the direction vector of reflection, the normal vector of the reflection plane, the intersection line of the reflection plane and imaging plane, and the normal vector of the transparent surface. To overcome the limitations of the s-component approximation assumption, the angle between the s-component and the polarization direction of the reflected light is analyzed, which yields improved measurement precision. An experiment was performed with transparent targets (flat glass positioned at different angles), and the results show that the measurement error with this method is significantly less than those of existing methods. Thus, we believe this method overcomes the abovementioned limitations while also improving measurement precision. (c) 2018 Optical Society of America
机译:使用透明对象的偏振的形状测量的现有方法基于两个假设:(1)假设反射光线平行于成像系统的光轴的剖视假设; (2)S组分近似假设,该假设假设反射光的S组分是主要的,并且忽略了P组分。为了克服这两个假设所带来的限制,本文提出了一种基于来自透明表面和矢量操作的反射偏振特性的方法。为了克服段状假设,通过向量操作推导出透明表面的正常矢量,分析反射方向矢量之间的关系,反射平面的正常矢量,反射平面和成像平面的交叉线,以及透明表面的正常矢量。为了克服S组件近似假设的局限性,分析了S-分量与反射光的偏振方向之间的角度,从而产生了改进的测量精度。用透明靶(位于不同角度的平板玻璃)进行实验,结果表明,该方法的测量误差明显小于现有方法。因此,我们认为这种方法克服了上述限制,同时还提高了测量精度。 (c)2018年光学学会

著录项

  • 来源
    《Applied optics》 |2018年第9期|共8页
  • 作者单位

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

    Beijing Inst Technol MOE Key Lab Optoelect Imaging Technol &

    Syst Beijing 100081 Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
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