...
首页> 外文期刊>Applied optics >Investigations of the MGy dose level radiation effects on the photometric budget of a radiation-hardened CMOS-based camera
【24h】

Investigations of the MGy dose level radiation effects on the photometric budget of a radiation-hardened CMOS-based camera

机译:对基于辐射硬化CMOS相机的光度预算的MGY剂量水平辐射效应的研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We studied the impact of ionizing radiation at high dose levels (megagray, MGy) on the photometric budget of a radiation-resistant complementary metal oxide semi-conductor (CMOS)-based camera. This is achieved by measuring the radiation-induced degradation of each subpart, namely its illumination system, its optical system, and its CMOS image sensor. The acquired experimental results allow performing a rather realistic simulation of the radiation effects at the system level. Thanks to appropriate mitigation techniques, limited image darkening and color change are obtained at MGy dose levels. The presented results confirm the feasibility of a CMOS-based camera able to resist to MGy dose level of ionizing radiations with an acceptable degradation of the image quality, opening the way to its implementation in the most challenging harsh environments. (C) 2019 Optical Society of America.
机译:我们研究了在高剂量水平(兆盖,MGY)上电离辐射对抗辐射互补金属氧化物半导体(CMOS)相机的光度预算的影响。 这是通过测量每个子部分的辐射诱导的辐射抗化,即其照明系统,光学系统及其CMOS图像传感器来实现的实现。 所获得的实验结果允许在系统级别进行相当逼真的辐射效应模拟。 由于适当的缓解技术,在MGY剂量水平下获得有限的图像变暗和颜色变化。 所提出的结果证实了基于CMOS的相机能够抵抗MGY剂量水平的电离辐射的可行性,具有可接受的图像质量的降解,在最具挑战性的恶劣环境中开启其实现。 (c)2019年光学学会。

著录项

  • 来源
    《Applied optics》 |2019年第22期|共8页
  • 作者单位

    CEA DAM DIF F-91297 Arpajon France;

    Univ Lyon Lab Hubert Curien LabHC CNRS UMR 5516 F-42000 St Etienne France;

    CEA DAM DIF F-91297 Arpajon France;

    CEA DAM DIF F-91297 Arpajon France;

    ISAE Supaero F-31055 Toulouse France;

    ISAE Supaero F-31055 Toulouse France;

    Univ Lyon Lab Hubert Curien LabHC CNRS UMR 5516 F-42000 St Etienne France;

    OPTSYS F-42007 St Etienne France;

    OPTSYS F-42007 St Etienne France;

    ORANO F-92400 Courbevoie France;

    IRSN PSN RES SCA F-91192 Gif Sur Yvette France;

    IRSN PSN RES SCA F-91192 Gif Sur Yvette France;

    Univ Lyon Lab Hubert Curien LabHC CNRS UMR 5516 F-42000 St Etienne France;

    Univ Lyon Lab Hubert Curien LabHC CNRS UMR 5516 F-42000 St Etienne France;

    Univ Lyon Lab Hubert Curien LabHC CNRS UMR 5516 F-42000 St Etienne France;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用;
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号