Direct optical imaging of structural inhomogeneities in crystalline materials

摘要

A method for optical imaging of structural inhomogeneities in crystalline materials is proposed, based on the differences in the optical properties of the structural inhomogeneity and the homogeneous material near the fundamental absorption edge of the crystalline material. The method can be used to detect defects in both semiconductors and insulators. (C) 2016 Optical Society of America