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Estimation of parameters for evaluating subsurface microcracks in glass with in-line digital holographic microscopy

机译:用型号数字全息显微镜评估玻璃地下微裂纹的参数估计

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摘要

In this work, a new method for imaging subsurface damage (SSD) is proposed, which is, to the best of our knowledge, the first application of the in-line digital holographic microscopy (IDHM) to the reconstruction of the subsurface damage in glass. By combination of the in-line arrangement and an objective lens to image the hologram on the CCD surface, the method is characterized by its high resolution in both the lateral and depth directions. Then the three-dimensional reconstruction of the microcracks within the glass was realized by numerically focusing en-face images at different depths, and the sizes of SSD along the transversal and depth directions were estimated. Based on the experimental results, the cracks can be divided into two categories: one is that the cracks begin from the surface of optical elements, the other is totally within the components. To indicate the propagation or development trajectory of the cracks and predict the magnitude of the laser-induced damage threshold, the relative intensity distributions of the light scattered by the cracks compared with the ones without cracks were also reconstructed. In this case all the required parameters for evaluating SSD are obtained with our IDHM system, so that the SSD produced in the manufacturing process can be reduced or removed more easily to optimize the performance of the optical component and extend its lifetime. These results provide the guidance for the optical system design of precision measurements. (C) 2015 Optical Society of America
机译:在这项工作中,提出了一种用于成像地下损伤(SSD)的新方法,这是我们的知识,首先将型号数字全息显微镜(IDHM)的第一应用于玻璃中的地下损坏的重建。通过在线布置和物镜与图像镜头的组合在CCD表面上进行图像,该方法的特征在于其在横向和深度方向上的高分辨率。然后通过数值聚焦在不同深度的孔面部图像中来实现玻璃内微裂纹的三维重建,并且估计沿横向和深度方向的SSD的尺寸。基于实验结果,裂缝可以分为两类:一个是裂缝从光学元件表面开始,另一个完全在部件内。为了指示裂缝的传播或开发轨迹并预测激光诱导的损伤阈值的大小,还重建了由裂缝散射的光的相对强度分布与没有裂缝的裂缝相比。在这种情况下,使用我们的IDHM系统获得用于评估SSD的所有所需参数,从而可以更容易地减少或移除制造过程中产生的SSD以优化光学部件的性能并延长其寿命。这些结果为精密测量的光学系统设计提供了指导。 (c)2015年光学学会

著录项

  • 来源
    《Applied optics》 |2016年第3期|共11页
  • 作者

    Wu Xiupin; Gao Wanrong; He Yong;

  • 作者单位

    Nanjing Univ Sci &

    Technol Dept Opt Engn 200 Xiao Ling Wei Nanjing 210094 Jiangsu Peoples R China;

    Nanjing Univ Sci &

    Technol Dept Opt Engn 200 Xiao Ling Wei Nanjing 210094 Jiangsu Peoples R China;

    Nanjing Univ Sci &

    Technol Dept Opt Engn 200 Xiao Ling Wei Nanjing 210094 Jiangsu Peoples R China;

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  • 正文语种 eng
  • 中图分类 应用;
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