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Nonnull interferometric testing of spherical gratings under Littrow conditions with opposite diffraction orders

机译:Littrow条件下的球形光栅与相反的衍射令的非空干涉测量测试

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摘要

Diffracted wavefront measurements are qualitative and comprehensive verifications for the spherical grating that was manufactured to specifications. Direct interferometric testing of the diffracted wavefront is convenient and implemented by tilting the spherical grating at a Littrow angle to obtain autoreflection and then results in a non-null interferometric testing configuration. The diffracted wavefront of the spherical grating contains not only wavefront errors induced by the manufacturing imperfections but also inherent wavefront contributions from the autoreflection testing setup. The magnitudes of the latter are affected by both the spherical substrate and the groove pattern. Through the analysis of geometric aberrations of spherical gratings, the groove pattern contributions are demonstrated to be contrary for the opposite diffraction orders. A non-null interferometric testing of spherical gratings is proposed without foreknowledge of the groove pattern, in which the wavefront errors contributed only by the manufacturing imperfections are derived from dual measurements under Littrow conditions with opposite diffraction orders. Simulations are implemented for varied line spacing (VLS) spherical gratings with an F-number slower than 1.5 and groove density varying from 150 to 300 lp/mm, and the residual error less than 0.004 lambda RMS is obtained. The residual misalignment error after conventionally removing defocus and tilt is further analyzed and discussed. A VLS grating in which theNAis 0.13 and groove density is 200 lp/mm is chosen as an experimental sample, and the diffracted wavefront error with 0.018 lambda RMSis obtained. (C) 2020 Optical Society of America
机译:衍射波前测量是用于制造规范的球形光栅的定性和综合验证。通过将球形光栅倾斜以获得自动射线,直接干涉对衍射波前的直接干涉性测试,以获得自动射线,然后导致非空干涉测试​​配置。球形光栅的衍射波前且不仅包含由制造缺陷诱导的波前误差,而且来自自动反射测试设置的固有的波前贡献。后者的幅度受到球形基板和凹槽图案的影响。通过分析球形光栅的几何像差,凹槽图案贡献被证明是相反的衍射令。提出了一种非空干涉测量测试球形光栅的沟槽图案的预先知识,其中仅由制造缺陷贡献的波前误差是从具有相反衍射令的Littrow条件下的双重测量来源的。模拟用于各种线间距(VLS)球形光栅,具有比1.5和从150升至300Lp / mm变化的槽密度,并且获得小于0.004λRMS的残余误差。进一步分析和讨论了常规去除散焦和倾斜之后的残差未对准误差。选择其中0.13和凹槽密度为200Lp / mm的VLS光栅作为实验样品,获得0.018λRMSI的衍射波前误差。 (c)2020美国光学学会

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  • 来源
    《Applied optics》 |2020年第21期|共8页
  • 作者单位

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

    Chinese Acad Sci Changchun Inst Opt Fine Mech &

    Phys Key Lab Opt Syst Adv Mfg Technol Changchun 130033 Peoples R China;

    Nanjing Univ Sci &

    Technol Sch Elect &

    Opt Engn Nanjing 210094 Peoples R China;

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  • 正文语种 eng
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