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首页> 外文期刊>Journal of Applied Polymer Science >Study of poly(vinyl chloride) interfaces using slow positron beams
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Study of poly(vinyl chloride) interfaces using slow positron beams

机译:慢正电子束研究聚氯乙烯界面

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Elemental and X-ray fluorescence analyses were performed to determine the chemical compositions of insulator and jacket poly(vinyl chloride) (PVC) samples. In addition, differential scanning calorimetry (DSC) measurement was performed to determine their glass-transition temperatures (T-g) and melting points. The effect of additives on the two investigated samples, as well as on a pure PVC sample, was studied using Doppler-broadening energy spectra coupled with the slow positron beam technique. Significant variation in the S parameter as a function of positron implantation energy and depth from the surface to the bulk was observed in all samples. The S parameter increased at a very low positron energy (< 1 keV), saturated to about 6 keV, and then decreased up to 27 keV. The S parameter (Delta S) changed to the extent of the change in the breadth of the distribution of free-volume defects, which was larger in the jacket PVC sample, which had more additives, than in the insulator PVC sample. (c) 2006 Wiley Periodicals, Inc.
机译:进行了元素和X射线荧光分析,以确定绝缘子和护套聚氯乙烯(PVC)样品的化学成分。另外,进行差示扫描量热法(DSC)测量以确定其玻璃化转变温度(T-g)和熔点。使用多普勒增宽能谱和慢正电子束技术研究了添加剂对两个研究样品以及纯PVC样品的影响。在所有样品中均观察到S参数随正电子注入能量和从表面到主体的深度的变化。 S参数在非常低的正电子能量(<1 keV)下增加,饱和到约6 keV,然后下降到27 keV。 S参数(ΔS)改变为自由体积缺陷的分布广度的变化程度,在具有更多添加剂的护套PVC样品中,该值大于绝缘子PVC样品中的值。 (c)2006年Wiley Periodicals,Inc.

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