Electronic speckle pattern interferometry and digital holographic interferometry with microbolometer arrays at 10.6 (mu)m

摘要

Electronic speckle pattern interferometry and digital holographic interferometry are investigated at long infrared wavelengths. Using such wavelengths allows one to extend the measurement range and decrease the sensitivity of the techniques to external perturbations. We discuss the behavior of reflection by the object surfaces due to the long wavelength. We have developed different experimental configurations associating a CO_(2) laser emitting at 10.6 (mu)m and microbolometer arrays. Phase-shifting in-plane and out-of-plane electronic speckle pattern interferometry and lensless digital holographic interferometry are demonstrated on rotation measurements of a solid object.