The refractive indices of optical materials are usually determined from spectrophotometric and ellipso-metric measurements of specular beams. When the roughness of the interfaces increases, the energy in the specularly reflected and transmitted beams decreases and scattering becomes predominant. For strong roughness (compared to the incident wavelength) a surface does not exhibit specular reflection or transmission, making difficult the determination of the refractive index. We describe two techniques, based on scattering measurements, that one can use to determine the refractive indices of opaque inhomogeneous media.
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