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Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis

机译:石英晶体微天平,用于微量热重分析

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摘要

A new method for analyzing the chemical purity and consistency of microscale samples with a quartz crystal microbalance (QCM) sensor platform is described. The QCM is used to monitor submicrogram changes in the mass of a deposited thin film as a function of temperature, in a manner similar to that of a conventional thermogravimetric analyzer (TGA). Results correlated well with TGA measurements for a wide range of representative materials, including organic compounds, ionic detergents, oxidizing and inert powders, carbon nanotubes, and various mixtures of these samples. In each case, the sample mass was on the order of a few micrograms, compared to the need for several milligrams for conventional TGA analysis. This work illustrates the effectiveness of this approach for analysis of nanoparticles, thin films, and highly purified specimens on the microgram scale.
机译:描述了一种使用石英晶体微量天平(QCM)传感器平台分析微量样品的化学纯度和一致性的新方法。 QCM以类似于常规热重分析仪(TGA)的方式用于监测沉积的薄膜质量随温度变化的亚微克变化。结果与多种代表性材料的TGA测量结果密切相关,这些材料包括有机化合物,离子去污剂,氧化性和惰性粉末,碳纳米管以及这些样品的各种混合物。在每种情况下,与传统的TGA分析所需的几毫克相比,样品的质量约为几微克。这项工作说明了这种方法在微克规模上分析纳米颗粒,薄膜和高度纯化的标本的有效性。

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