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首页> 外文期刊>Surface Science >Voltage-induced chemical contrast in scanning tunneling microscopy using tips chemically modified with hydrogen bond donors
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Voltage-induced chemical contrast in scanning tunneling microscopy using tips chemically modified with hydrogen bond donors

机译:扫描隧道显微镜中电压诱导的化学对比,使用氢键供体化学修饰的探针

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摘要

In-situ voltage treatment to induce chemical contrast in scanning tunneling microscopy images has previously been demonstrated only in one case, i.e., with tips modified with a hydrogen bond acceptor. In this work, this method has been applied to induce chemical contrast using tips modified with a self-assembled monolayer of 4-mercaptobenzoic acid, a hydrogen bond donor. Chemical contrast enhancement, which allows recognition of particular functional groups, is ascribed to the chemically selective interaction of the hydrogen bond donating carboxyl group of 4-mercaptobenzoic acid and the hydrogen bond accepting ether oxygens in sample monolayers formed on highly oriented pyrolytic graphite. Surfaces initially showing no chemical contrast enhancement were made to show such contrast enhancement by applying a + 2.0 V pulse to the STM tip for 15 s. The chemical contrast could also be removed from images using 15s treatments with a voltage of the opposite sign, i.e., —2.0 V. The effectiveness of inducing chemical contrast using this voltage treatment and the tip lifetime are compared for tips modified with 4-mercaptopyridine and 4-mercaptobenzoic acid.
机译:先前仅在一种情况下,即用氢键受体修饰的尖端,证明了在扫描隧道显微镜图像中引起化学对比的原位电压处理。在这项工作中,该方法已被应用到使用由4-巯基苯甲酸(氢键供体)的自组装单层修饰的针尖诱导化学对比的方法。化学对比度增强可以识别特定的官能团,这归因于在高取向热解石墨上形成的样品单层中4-巯基苯甲酸的氢键给体羧基与接受醚氧的氢键的化学选择性相互作用。通过向STM尖端施加+ 2.0 V脉冲15 s,使最初没有显示化学对比度增强的表面显示出这种对比度增强。也可以使用符号相反的电压(即-2.0 V)进行15秒处理,从图像中去除化学对比。对于使用4-巯基吡啶和4-巯基苯甲酸。

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