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首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 12-b 1-GS/s 31.5-mW Time-Interleaved SAR ADC With Analog HPF-Assisted Skew Calibration and Randomly Sampling Reference ADC
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A 12-b 1-GS/s 31.5-mW Time-Interleaved SAR ADC With Analog HPF-Assisted Skew Calibration and Randomly Sampling Reference ADC

机译:具有模拟HPF辅助偏斜校准和随机采样参考ADC的12b 1-GS / s 31.5mW时间交错SAR ADC

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This paper presents a 12-b, 1-GS/s ADC array, realized by time-interleaving four 250-MS/s pipelined SAR ADCs, with integrated on-chip reference voltage buffers. A reference ADC-based calibration algorithm treats static nonlinearity, gain, and offset errors in the array. Timing-skew errors between the sub-ADCs are distinguished from those of the gain mismatches by the assistance of an analog high-pass filter (HPF) for input slope information and subsequently corrected by digitally controlled delay lines (DCDLs). Directly driven off the on-chip 50-Omega termination resistors without any dedicated input buffer, the 65-nm CMOS prototype ADC array also employs a frequency-hopped, randomly-sampling scheme for the ref. ADC, eliminating the spectral effect of its interference to the main array. The core ADC consumes 31.5 mW and occupies an area of 0.27 mm(2), including nine on-chip reference voltage buffers, the ref. ADC, and the HPF path. The measured peak signal to noise and distortion ratio of the array is 65.3 dB, and the measured spurious-free dynamic range is >70 dB from dc to 500 MHz at 1 GS/s with calibration. The prototype ADC chip achieves an figure of merit of 20.9 and 59.7 fJ/step (the latter is limited by the jitter of an off-chip clock source) for a low-frequency input and a Nyquist input, respectively.
机译:本文介绍了一个12b,1-GS / s ADC阵列,该阵列通过对四个250-MS / s流水线SAR ADC进行时间交织,并集成了片上基准电压缓冲器来实现。基于参考ADC的校准算法可处理阵列中的静态非线性,增益和失调误差。借助用于输入斜率信息的模拟高通滤波器(HPF)的帮助,子ADC之间的时序偏斜误差与增益失配的误差偏斜得以区别,随后通过数控延迟线(DCDL)进行校正。 65nm CMOS原型ADC阵列无需任何专用输入缓冲器即可直接从片上50Ω端接电阻驱除,该器件还为基准采用了跳频,随机采样方案。 ADC,消除了其对主阵列干扰的频谱影响。内核ADC的功耗为31.5 mW,占地为0.27 mm(2),其中包括9个片内基准电压缓冲器ref。 ADC和HPF路径。在校准后,以1 GS / s的速度从DC到500 MHz时,测得的峰峰值信噪比和失真率为65.3 dB,并且测得的无杂散动态范围> 70 dB。原型ADC芯片的低频输入和Nyquist输入的品质因数分别为20.9和59.7 fJ / step(后者受片外时钟源的抖动限制)。

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