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首页> 外文期刊>Solar Energy >Degradation of mono-crystalline photovoltaic modules after 22 years of outdoor exposure in the composite climate of India
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Degradation of mono-crystalline photovoltaic modules after 22 years of outdoor exposure in the composite climate of India

机译:印度复合气候下户外暴露22年后单晶光伏组件的降解

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摘要

The understanding of degradation modes and mechanism is very important in order to ensure the lifetime of 25-30 years of PV modules. In the present study, degradation analysis of 90 mono-crystalline silicon PV modules installed on the rooftop of the guest house of National Institute of Solar Energy (NISE), Gurgaon has been carried out after 22 years of outdoor operation in a composite climate of India. A comprehensive analysis has been carried out through visual inspection, thermal imaging, characteristic and insulation resistance measurement as well as rate of degradation has been calculated. The defects in bus bar, cell inter-connection ribbon, string inter-connection ribbon and chalking in back-sheet are found to be most frequently observed defects. Hot spot in solar cell, burn mark and delamination in back-sheet are also observed in some PV modules. The average power degradation rate of 90 PV modules over period of 22 years has been found to be about 1.9%/year with maximum rate of power degradation 4.1%/year and minimum is 0.3%/year. Insulation resistance measurement of all the modules both in dry and wet condition showed that only 9 modules have shown insulation resistance <400 M Omega. The study addresses the degradation mechanism in order to assess the safety issues related to the large scale PV plants in Indian climatic condition. (C) 2016 Published by Elsevier Ltd.
机译:为了确保光伏组件的使用寿命为25-30年,了解降解模式和机理非常重要。在本研究中,在印度复合气候下进行了22年的室外操作后,对古尔冈国家太阳能研究所(NISE)招待所​​屋顶上安装的90个单晶硅光伏组件进行了降解分析。 。通过目视检查,热成像,特性和绝缘电阻测量进行了综合分析,并计算了退化率。发现母线,电池互连带,线互连带和背板粉化中的缺陷是最常观察到的缺陷。在某些光伏组件中还观察到太阳能电池的热点,烧伤痕迹和背板的分层。已经发现,在22年内,90个光伏组件的平均功率衰减率约为1.9%/年,最大功率衰减率为4.1%/年,最小功率衰减率为0.3%/年。测量所有模块在干燥和潮湿条件下的绝缘电阻,结果表明只有9个模块的绝缘电阻<400 M Omega。该研究针对降解机理,以评估与印度气候条件下的大型光伏电站有关的安全性问题。 (C)2016由Elsevier Ltd.出版

著录项

  • 来源
    《Solar Energy》 |2016年第10期|786-795|共10页
  • 作者单位

    Indian Inst Technol Delhi, Ctr Energy Studies, New Delhi 110016, India;

    Indian Inst Technol Delhi, Ctr Energy Studies, New Delhi 110016, India;

    Minist New & Renewable Energy, Natl Inst Solar Energy, New Delhi 110003, India;

    Minist New & Renewable Energy, Natl Inst Solar Energy, New Delhi 110003, India;

    Minist New & Renewable Energy, Natl Inst Solar Energy, New Delhi 110003, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Mono-crystalline; Degradation; Reliability; IR thermography; Insulation resistance;

    机译:单晶降解可靠性红外热成像绝缘电阻;

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