Double-Layer coating for field-emission Cryo-Scanning electron microscopy-Present state and applications

摘要

Imaging of fast-frozen samples is the most direct approach for electron microscopy of organic material. It pre- vents chemical fixation and drying artifacts. Frozen samples can be replicated and imaged in the transmission electron microscope (TEM), or they can be directly visualized in the cryo-scanning electron microscope (cryo-SEM). Double- layer coating combines these two techniques and many of their advantages.