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Experimental characterization of arc instabilities and their effect on current chopping in low-surge vacuum interrupters

机译:低浪涌真空灭弧室中电弧不稳定性的实验表征及其对电流斩波的影响

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摘要

In low-current vacuum arcs, short (>500-ns) peaks in arc voltage (instabilities), with a height of up to ten times the normal arc voltage, are abundantly present. The instabilities are thought to be caused by ion starvation near the anode. A number of parameters of these instabilities, occurring in vacuum interrupters with AgWC (low-surge) and CuCr (conventional) contact material, have been analyzed statistically in a practical AC circuit. A striking difference in median rate of rise and height is found. It is found plausible that these parameters reflect important switching characteristics such as recovery (peak rate of rise) and current chopping level (peak height). Also, the dependence of the parameters on momentary arc current and contact distance is studied and explained qualitatively.
机译:在低电流真空电弧中,大量存在电弧电压(不稳定性)的短峰值(> 500 ns),高度高达正常电弧电压的十倍。不稳定性被认为是由阳极附近的离子饥饿引起的。在实际的交流电路中,已经对使用AgWC(低浪涌)和CuCr(常规)接触材料的真空灭弧室中出现的许多不稳定性参数进行了统计分析。发现中位数上升率和身高有显着差异。可以发现,这些参数反映出重要的开关特性,例如恢复(上升峰值速率)和电流斩波水平(峰值高度)。同样,定性地研究和解释了参数对瞬时电弧电流和接触距离的依赖性。

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