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首页> 外文期刊>Photonics Journal, IEEE >Monolithic Integration of Surface Plasmon Detector and Metal–Oxide–Semiconductor Field-Effect Transistors
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Monolithic Integration of Surface Plasmon Detector and Metal–Oxide–Semiconductor Field-Effect Transistors

机译:表面等离子体探测器与金属氧化物半导体场效应晶体管的单片集成

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The monolithic integration of a silicon-based plasmonic detector with metal- oxide-semiconductor field-effect transistors (MOSFETs) was demonstrated. The plasmonic detector consisted of a gold film with a nanoslit grating on a silicon substrate and was operated at a free-space wavelength of 1550 nm. The structure of the nanoslit grating was optimized by using the finite-difference time-domain method. The output current from the plasmonic detector was amplified by ~14 000 times using the monolithically integrated MOSFETs. In addition, dynamic operation of the integrated circuit was demonstrated by modulation of the intensity of a beam that was incident to the plasmonic detector.
机译:演示了硅基等离子体检测器与金属氧化物半导体场效应晶体管(MOSFET)的单片集成。等离子体探测器由在硅基板上具有纳米狭缝光栅的金膜组成,并在1550 nm的自由空间波长下运行。利用时域有限差分法优化了纳米缝光栅的结构。使用单片集成MOSFET,等离子体检测器的输出电流被放大了约14000倍。另外,通过调制入射到等离子体探测器的光束的强度来证明集成电路的动态操作。

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    《Photonics Journal, IEEE》 |2013年第4期|6800609-6800609|共1页
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