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Effects of Cl_2 plasma treatment on stability, wettability, and electrical properties of ITO for OLEDs

机译:Cl_2等离子体处理对ITO ITO稳定性,润湿性和电学性能的影响

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摘要

We investigated various characteristics of chlorinated indium tin oxide (Cl-ITO) for highly efficient organic light emitting diodes (OLEDs): the work function, surface morphology, wetting characteristic, and hole-injection property. Via the systematic analysis of Cl-ITO, we showed that the modification of ITO using the plasma treatment method has a simple process and offers higher stability than that achieved with a solution-based modification method. We fabricated Cl-ITO with a high work function of 6.04 eV, which is 1.04 eV higher than that of pristine ITO. We verified that Cl-2 plasma treatment does not affect the ITO surface morphology. The Cl halogenated surface showed a low surface polarity and influenced the growth of the organic material, especially for films as thin as similar to 4 nm. Therefore, we found when using ultra-thin film on Cl-ITO for design devices, the wetting characteristic of Cl-ITO should be considered. In addition, using tris-(4-carbazoyl-9-ylphenyl)-amine resulted in increased current and power efficiencies compared with those obtained using 4,4'-N,N'-dicarbazolebiphenyl. When a carrier-only device was used, the carrier-injection characteristics of Cl-ITO were higher than those of other well-known hole-injection materials. Furthermore, the Cl-ITO OLEDs showed higher stability than OLEDs with other hole-injection materials.
机译:我们研究了用于高效有机发光二极管(OLED)的氯化铟锡氧化物(Cl-ITO)的各种特性:功函,表面形态,润湿特性和空穴注入性能。通过对Cl-ITO的系统分析,我们发现,使用等离子处理方法对ITO进行修饰的过程比基于溶液的修饰方法简单,并且具有更高的稳定性。我们制造了具有6.04 eV的高功函数的Cl-ITO,比原始ITO高1.04 eV。我们验证了Cl-2等离子体处理不会影响ITO表面形态。 Cl卤化的表面显示出低的表面极性,并影响了有机材料的生长,特别是对于厚度约4 nm的薄膜而言。因此,我们发现在设计设备上使用Cl-ITO上的超薄膜时,应考虑Cl-ITO的润湿特性。另外,与使用4,4'-N,N'-二咔唑联苯获得的电流和功率效率相比,使用三-(4-咔唑基-9-基苯基)-胺导致电流和功率效率提高。当使用仅载流子装置时,Cl-ITO的载流子注入特性高于其他公知的空穴注入材料。此外,Cl-ITO OLED的稳定性高于具有其他空穴注入材料的OLED。

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