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Room temperature deposition of ZnO and Al:ZnO ultrathin films on glass and PET substrates by DC sputtering technique

机译:直流溅射技术在玻璃和PET基板上室温沉积ZnO和Al:ZnO超薄膜

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摘要

In the present work, ultrathin films of Zinc oxide (ZnO) and Aluminum doped zinc oxide (AZO) with 20 nm thick were fabricated at 300 K on glass and Polyethylene terephthalate (PET) substrates by means of direct-current sputtering method. The structural morphology of the films were analyzed by (XRD) diffractometry. The average transmit-tance of films deposited on different substrates showed high transparency (over 80%) in the visible spectrum. The objective of the present work is to investigate the thicknesses and optical constants of ZnO and AZO ultrathin films prepared by DC sputtering onto (glass and PET) substrates using two methods (UV-Vis-NIR spectrophotometer and ellipsometer (SE) by new amorphous dispersion formula) with comparison to check and confirm the results that obtained from UV with those obtained from SE measurements. The optical constants of films were extracted and compared using UV and SE techniques in the range of (200-2200 nm) with increment of 1 nm in order to confirm the accuracy of the UV and shown an excellent agreement.
机译:在本工作中,通过直流溅射法在玻璃和聚对苯二甲酸乙二酯(PET)基板上以300 K的厚度制造了厚度为20 nm的氧化锌(ZnO)和掺铝的氧化锌(AZO)的超薄膜。通过(XRD)衍射分析膜的结构形态。沉积在不同基板上的薄膜的平均透射率在可见光谱中显示出高透明度(超过80%)。本工作的目的是研究通过两种新方法(UV-Vis-NIR分光光度计和椭偏仪(SE))通过新型非晶态分散体通过直流溅射在(玻璃和PET)基板上制备的ZnO和AZO超薄膜的厚度和光学常数。公式)进行比较,以检查并确认从UV获得的结果与从SE测量获得的结果。提取膜的光学常数,并使用UV和SE技术在(200-2200 nm)范围内以1 nm的增量进行比较,以确认UV的准确性,并显示出极好的一致性。

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