首页> 外文期刊>Optical and quantum electronics >Improvement of minority carrier collection and quantum efficiency in graphene planar silicon solar cell
【24h】

Improvement of minority carrier collection and quantum efficiency in graphene planar silicon solar cell

机译:石墨烯平面硅太阳能电池中少数载流子的收集和量子效率的提高

获取原文
获取原文并翻译 | 示例
           

摘要

Graphene planar silicon heterojunction solar cells were investigated using 2D physics-based TCAD simulation. A planar structure consisting of graphene layer as the hole transport material, and n-type silicon as substrate is simulated. Process modeling has been carried out especially for highly boron diffusion. Using this model, the effect of the highly doped surface inverse region located as 0.08, 0.22, 0.35 urn on the photovoltaic performance has been studied. The obtained J-V characteristic is analyzed to study effects of the inverse region depth and doping concentration on Schottky junction modification. The proposed design proves to be highly efficient in 0.2 h annealing, which provides a new platform to further enhance the performance of graphene planar solar cell.
机译:使用基于2D物理的TCAD仿真研究了石墨烯平面硅异质结太阳能电池。模拟了由石墨烯层作为空穴传输材料,n型硅作为衬底组成的平面结构。特别是对于高硼扩散已经进行了工艺建模。使用该模型,研究了高掺杂的表面逆区分别为0.08、0.22、0.35 um对光电性能的影响。分析获得的J-V特性,以研究反区域深度和掺杂浓度对肖特基结修饰的影响。所提出的设计在0.2 h退火中被证明是高效的,这为进一步增强石墨烯平面太阳能电池的性能提供了一个新平台。

著录项

  • 来源
    《Optical and quantum electronics》 |2017年第4期|144.1-144.9|共9页
  • 作者单位

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China,Jiangsu Province Cultivation Base for State Key Laboratory of Photovoltaic Science and Technology, Changzhou University, Changzhou 213164, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

    School of Physics and Electronic Engineering, Changshu Institute of Technology, Changshu 215500, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Minority carrier; Boron doped; Graphene silicon Schottky barrier;

    机译:少数族裔携带者;硼掺杂;石墨烯硅肖特基势垒;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号