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Influence of CX-reactions on the radiation in the pedestal region at ASDEX Upgrade

机译:CX反应对Asdex升级基座区域辐射的影响

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The radial density profiles of Ne~(10+) and Ne~(8+) have been measured with charge exchange recombination spectroscopy in an H-mode discharge in ASDEX Upgrade. When trying to fit the data with an impurity transport code that only takes electronic ionisation and recombination into account, the density of Ne~(8+) is too low by more than an order of magnitude indicating that an additional recombination mechanism must be at work. We ascribe the missing recombination channel to charge exchange (CX) reactions between neutral deuterium and the impurity ions, which has long been known to be a very efficient recombination reaction. Including the CX-reactions yields a good fit of the ionisation balance and delivers the neutral density profile in the pedestal, which is not known from other diagnostics. Here, the CX-reactions lead to a change of the ionisation balance on the whole flux surface and the measurement delivers a flux surface averaged neutral density with the exception of the region very close to the X-point. Furthermore, it leads to an increase of the pedestal radiation of neon since the partially ionised stages can emit line radiation. This amounts to an increase of the radiated power of neon inside of the separatrix by a factor of 5. A similar analysis was done for argon in an H-mode discharge dominated by Ar radiation. Only the CX-recombination in the pedestal can explain the radiated power inside the separatrix, which would be too low by a factor of 2.2 without CX. In addition, the radiances of VUV lines from many charge stages are much better fitted when including the CX-recombination. A simple projection of the impact of CX-recombination to the much hotter ITER pedestals shows that for elements up to Kr, a beneficial increase of edge radiated power per core radiated power and of radiated power per central dilution is obtained, while for Xe and especially for W the effect is weak.
机译:在ASDEX升级中的H模式放电中,通过电荷交换重组光谱测量NE〜(10+)和NE〜(8+)的径向密度分布。当尝试使用仅采用电子电离和重组的杂质传输代码拟合数据时,Ne〜(8+)的密度太低,表示额外的重组机构必须在工作中。我们将缺失的重组通道归因于中性氘和杂质离子之间的电荷交换(CX)反应,这些反应已经已知是一种非常有效的重组反应。包括CX反应产生良好的电离平衡件,并在基座中提供中性密度曲线,其在其他诊断中未知。这里,CX反应导致整个磁通表面上的电离平衡的变化,并且测量输送磁通表面平均中性密度,除了非常接近X点的区域之外。此外,由于部分电离阶段可以发射线辐射,因此它导致氖的基座辐射的增加。这通常会增加分离器内部的氖气辐射力的因子5.在由Ar辐射支配的H模式放电中进行类似的分析。只有基座中的CX-REFOMPINATION可以解释分离器内的辐射电力,这在没有CX的情况下将太低为2.2。此外,在包括CX重组时,来自许多电荷阶段的VUV线路的辐射大得多更好地安装。简单地投影CX-REFOMPININCINATION对更热的镜子基座的影响表明,对于高达KR的元件,获得每个芯辐射功率和每个中央稀释的辐射功率的有益增加,而XE,特别是对于W,效果很弱。

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