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Effect of W self-implantation and He plasma exposure on early-stage defect and bubble formation in tungsten

机译:W自植入与血浆暴露在钨中早期缺陷和泡沫形成的影响

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摘要

To determine the effect of pre-existing defects on helium-vacancy cluster nucleation and growth, tungsten samples were self-implanted with 1 MeV tungsten ions at varying fluences to induce radiation damage, then subsequently exposed to helium plasma in the MAGPIE linear plasma device. Positron annihilation lifetime spectroscopy was performed both immediately after self-implantation, and again after plasma exposure. After self-implantation vacancies clusters were not observed near the sample surface (<30nm). At greater depths (30-150nm) vacancy clusters formed, and were found to increase in size with increasing W-ion fluence. After helium plasma exposure in the MAGPIE linear plasma device at ~300 K with a fluence of 10~(23) He-m~(-2), deep (30-150nm) vacancy clusters showed similar positron lifetimes, while shallow (<30nm) clusters were not observed. The intensity of positron lifetime signals fell for most samples after plasma exposure, indicating that defects were filling with helium. The absence of shallow clusters indicates that helium requires pre-existing defects in order to drive vacancy cluster growth at 300 K. Further samples that had not been pre-damaged with W-ions were also exposed to helium plasma in MAGPIE across fluences from 1 × 10~(22) to 1.2 × 10~(24) He-m~(-2). Samples exposed to fluences up to 1 × 10~(23) He-m~(-2) showed no signs of damage. Fluences of 5 × 10~(23) He-m~(-2) and higher showed significant helium-cluster formation within the first 30nm, with positron lifetimes in the vicinity 0.5-0.6 ns. The sample temperature was significantly higher for these higher fluence exposures (~400 K) due to plasma heating. This higher temperature likely enhanced bubble formation by significantly increasing the rate interstitial helium clusters generate vacancies, which is we suspect is the rate-limiting step for helium-vacancy cluster/ bubble nucleation in the absence of pre-existing defects.
机译:为了确定预先存在于氦气空位的缺陷对氦气空心核心成核和生长的影响,钨样品以不同的流量自植入1meV钨离子,以诱导辐射损伤,然后在鹊线性等离子体器件中暴露于氦血浆。正电子湮没寿命光谱检查在自植入后立即进行,并且在血浆暴露后再次进行。在样品表面(<30nm)附近未观察到自植入空位簇之后。在更大的深度(30-150nm)形成的空位簇中,并且发现随着W离子注量的增加而增加。在Magpie线性等离子体装置中氦浆浆液〜300K的血浆浆液,流量为10〜(23)HE-M〜(2),深(30-150nm)空位簇显示出类似的正电子寿命,而浅(<30nm )没有观察到群集。正电子寿命信号的强度为血浆暴露后大多数样品均落下,表明缺陷用氦气填充。没有浅簇表明氦需要预先存在的缺陷,以便在300k下推动空位簇生长。另外没有用W-离子预先损坏的样品,也暴露于杂志的氦血浆,从1倍的流利的流利的流利。 10〜(22)至1.2×10〜(24)HE-M〜(-2)。暴露于流量高达1×10〜(23)HE-M〜(-2)的样品显示出没有损坏的迹象。流量为5×10〜(23)He-m〜(-2)和更高的氦气在前30nm内显示出显着的氦簇形成,附近的正电子寿命为0.5-0.6ns。对于由于等离子体加热,对于这些较高的流量暴露(〜400k),样品温度显着较高。这种较高的温度可能通过显着增加速率间质氦群产生空位的速度增加,这是我们怀疑是在没有预先存在的缺陷的情况下为氦气空位簇/泡沫成核的速率限制步骤。

著录项

  • 来源
    《Nuclear fusion》 |2018年第6期|066010.1-066010.9|共9页
  • 作者单位

    Plasma Research Laboratory Research School of Physics and Engineering Australian National University Canberra Australia;

    Plasma Research Laboratory Research School of Physics and Engineering Australian National University Canberra Australia;

    Plasma Research Laboratory Research School of Physics and Engineering Australian National University Canberra Australia;

    Department of Electronic Materials Engineering Research School of Physics and Engineering Australian National University Canberra Australia;

    Department of Electronic Materials Engineering Research School of Physics and Engineering Australian National University Canberra Australia;

    Australian Synchrotron 800 Blackburn Road Clayton VIC 3168 Australia;

    Australian Nuclear Science and Technology Organisation Sydney Australia;

    Plasma Research Laboratory Research School of Physics and Engineering Australian National University Canberra Australia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    positron annihilation lifetime spectroscopy; tungsten; ion damage; helium plasma; grazing incidence small angle x-ray scattering;

    机译:正电子湮没寿命光谱;钨;离子损伤;氦血浆;放牧发病小角度X射线散射;

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