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Cell-on-Buffer: New design approach for high-performance and low-power monolithic 3D integrated circuits

机译:缓冲单元:高性能和低功耗单片3D集成电路的新设计方法

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Monolithic 3D Integration technology (M3D) provides high density vertical interconnects allowing new design approaches such as Cell-on-Cell (gate level approach) and NMOS-on-PMOS (transistor level approach). This work proposes a 3D Cell-on-Buffer (3DCoB) design approach by separating the logical functioning stage of a gate from its driving stage, then vertically stacking them. The proposed 3DCoB approach demonstrates better performances compared to the 2D implementation and the conventional 3D approaches. A Multi-VDD low power technique is applied to 3DCoB cells (i.e. a different power supply for each tier). The multi-VDD 3DCoB technique provides total power reduction with limited performances degradation compared to the single-VDD 3DCoB approach. 3DCoB with single- and Multi- VDD techniques are applied on a set of benchmark designs in 28 nm-FDSOI technology using conventional sign-off place and route flow. Implementation results show up to 35% increment in performance and up to 21.8% reduction in the total power compared to 2D designs.
机译:单片3D集成技术(M3D)提供了高密度垂直互连,从而允许采用新的设计方法,例如单元对单元(门级方法)和NMOS对PMOS(晶体管级方法)。这项工作提出了一种3D缓冲单元(3DCoB)设计方法,方法是将门的逻辑功能阶段与其驱动阶段分开,然后垂直堆叠它们。与2D实现和传统3D方法相比,提出的3DCoB方法展示出更好的性能。多VDD低功耗技术已应用于3DCoB单元(即,每个层使用不同的电源)。与单VDD 3DCoB方法相比,多VDD 3DCoB技术可降低总功耗,并降低性能。使用传统签核位置和路径流程,将具有单VDD和多VDD技术的3DCoB应用于采用28 nm-FDSOI技术的一组基准设计。实施结果显示,与2D设计相比,性能提高了35%,总功耗降低了21.8%。

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