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首页> 外文期刊>Journal of power sources >The role of SKO2 and sintering temperature on the grain boundary properties of Ce0.8Sm0.2O2-δ
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The role of SKO2 and sintering temperature on the grain boundary properties of Ce0.8Sm0.2O2-δ

机译:SKO2和烧结温度对Ce0.8Sm0.2O2-δ晶界性能的影响

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摘要

The solid solution Ce0.8Sm0.2O2-δ (20CSO) was synthesized by freeze-drying precursor procedure. Well-crystallized powders with nanometric grain sizes were obtained after calcining the precursor at 375 C for 4h. The effect of SiO2-addition and sintering temperature on the properties of the bulk and grain boundary processes were studied. For this purpose, 20CSO-SiO2 samples were prepared by the addition of 0.05 or0.5mol% SiO2 to Ce0.8Sm0.202-δ, in the form of tetraethyl orthosilicate (TEOS). Also, 2mol% Co was added to some of the precalcined compositions with and without silica-addition. Cobalt free samples were sintered at 1400,1500 and 1600 C and cobalt-added samples were sintered 1150℃, for 10 h to obtain dense pellets. The electrical behaviour of the bulk was revealed to be nearly independent on sintering temperature and/or on the addition of impurities of SiO2 and Co to the grain boundaries. This was explained by the low solubility of impurities in the grain fluorite structure. However, the grain boundary resistance showed important differences as function of sintering temperature and with the presence of impurities. The analysis of grain boundary properties suggests that segregated impurities affect the microstructure and also segregation of Sm at the space charge layer, thus changing both the specific grain boundary conductivity and microstructural parameters.
机译:通过冷冻干燥前体程序合成了固溶体Ce0.8Sm0.2O2-δ(20CSO)。在将前体在375 C煅烧4小时后,获得了具有纳米级晶粒度的结晶良好的粉末。研究了SiO 2的添加和烧结温度对块体和晶界过程性能的影响。为此,通过将0.05或0.5mol%的SiO2添加到原硅酸四乙酯(TEOS)形式的Ce0.8Sm0.202-δ中来制备20CSO-SiO2样品。另外,在添加和不添加二氧化硅的情况下,将2mol%的Co添加到一些预煅烧的组合物中。在1400,1500和1600 C下烧结无钴样品,并在1150℃下烧结添加钴的样品10 h,以获得致密颗粒。结果表明,该块的电学行为几乎与烧结温度和/或SiO 2和Co的杂质向晶界的添加无关。这可以通过杂质在萤石晶粒结构中的低溶解度来解释。然而,作为烧结温度的函数以及存在杂质,晶界电阻显示出重要的差异。晶界性质的分析表明,偏析杂质会影响空间电荷层中Sm的微观结构和偏析,从而改变特定的晶界电导率和微观结构参数。

著录项

  • 来源
    《Journal of power sources》 |2011年第20期|p.8383-8390|共8页
  • 作者单位

    Instituto de Ceramica y Vidrio (CSIC), Cantoblanco, 28049 Madrid. Spain;

    Dep. Quimica Inorganica, Universidad de La Laguna, 38200 La Laguna, Tenerife. Spain;

    Dep. Engenharia Ceramica e do Vidrio. CICECO Universidade deAveiro, 3810-193 Aveiro, Portugal;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    ceria; silica; impedance spectroscopy; grain boundary; electrolyte;

    机译:二氧化铈;二氧化硅;阻抗谱;晶界;电解质;

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