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首页> 外文期刊>International journal of plant sciences >COMPARISON OF DIFFERENT METHODS FOR THE DETECTION OF SILICA INCLUSIONS IN PLANT TISSUES
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COMPARISON OF DIFFERENT METHODS FOR THE DETECTION OF SILICA INCLUSIONS IN PLANT TISSUES

机译:检测植物组织中二氧化硅夹杂物的不同方法的比较

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摘要

There is no standardized method to detect silica depositions in plant tissues. Therefore, we compared current methods to reveal their advantages and disadvantages for selecting the most suitable method. We studied three plant species (Equisetum hyentale, Carex pendula, and Miscanthus sinensis) with pronounced and well-defined silica inclusions of different forms. We used two SEM methods, two stainings for light microscopy, and Raman imaging. Our results showed that energy-dispersive x-ray (EDX) analysis is highly specific but has a lower resolution than low-voltage-high-contrast (vCD) detection, which gives good resolution and a broad scanning area. In addition to the nonspecificity of vCD detection, it can be difficult to identify silica coatings with this method because of a lack of contrast with non-silica-coated tissues. Therefore, confirmation of silica detection with EDX is needed. In all plants tested, staining proved to be not silica specific but did allow for an indication of the position of silica inclusions, facilitating later, more specific analysis. Silica detection via Raman imaging might be affected by interference, depending on the sample, but it is the sole method tested that allows for distinguishing different types of silica inclusions chemically. A combination of EDX and vCD analysis provides the best results for locating the exact position of silica inclusions.
机译:没有检测植物组织中二氧化硅沉积的标准化方法。因此,我们比较了当前的方法,以揭示它们在选择最合适的方法时的优缺点。我们研究了三种植物物种(大马士革木,Carex pendula和Miscanthus sinensis),它们具有明显且定义明确的不同形式的二氧化硅包裹体。我们使用了两种SEM方法,两次用于光学显微镜的染色和拉曼成像。我们的结果表明,能量色散X射线(EDX)分析具有很高的特异性,但比低电压高对比度(vCD)检测具有更低的分辨率,它具有良好的分辨率和广阔的扫描范围。除了vCD检测的非特异性外,由于与非二氧化硅涂层的组织缺乏对比,使用这种方法可能难以鉴定二氧化硅涂层。因此,需要用EDX确认二氧化硅检测。在所有测试的植物中,染色证明不是二氧化硅特异的,但确实可以指示二氧化硅内含物的位置,从而便于以后进行更具体的分析。通过拉曼成像进行二氧化硅检测可能会受到干扰的影响,具体取决于样品,但这是经过测试的唯一方法,可以从化学上区分不同类型的二氧化硅夹杂物。 EDX和vCD分析的结合可为确定二氧化硅夹杂物的确切位置提供最佳结果。

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  • 来源
    《International journal of plant sciences》 |2012年第3期|p.229-238|共10页
  • 作者单位

    Plant Biomechanics Group, Botanic Garden of the Albert-Ludwigs-University, Faculty of Biology, Schanzlestrasse 1, 79104 Freiburg im Breisgau, Germany;

    Plant Biomechanics Group, Botanic Garden of the Albert-Ludwigs-University, Faculty of Biology, Schanzlestrasse 1, 79104 Freiburg im Breisgau, Germany;

    Freiburg Materials Research Center and Institute of Macromolecular Chemistry,Albert-Ludwigs-University, Stefan-Meier-Stra?e 21-31, 79104 Freiburg im Breisgau, Germany;

    Plant Biomechanics Group, Botanic Garden of the Albert-Ludwigs-University, Faculty of Biology, Schanzlestrasse 1, 79104 Freiburg im Breisgau, Germany Freiburg Materials Research Center and Institute of Macromolecular Chemistry,Albert-Ludwigs-University, Stefan-Meier-Stra?e 21-31, 79104 Freiburg im Breisgau, Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    silica detection; energy-dispersive x-ray analysis; backscattered electron imaging; light microscopy; raman imaging; plant tissue;

    机译:二氧化硅检测;能量色散X射线分析;背散射电子成像;光学显微镜拉曼成像植物组织;

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