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Morphology of pores produced in n-Si {100} by etching in hydrofluoric acid solutions

机译:在氢氟酸溶液中蚀刻而在n-Si {100}中产生的孔的形貌

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摘要

Variations in the contours of pores produced in n-type silicon by electrochemical etching in hydrofluoric acid solutions are interpreted in terms of the mechanism underlying the chemical interaction of the etchant with silicon and the anisotropy of the etchant-silicon system. Mathematical expressions are proposed which describe the contours and limiting radial sizes of pores forming at the very beginning of the etching process (similar to 10-15 s).
机译:通过腐蚀剂与硅之间的化学相互作用和腐蚀剂-硅系统的各向异性所依据的机理来解释在氢氟酸溶液中通过电化学腐蚀在n型硅中产生的孔的轮廓的变化。提出了数学表达式,该数学表达式描述了在蚀刻过程的最开始(类似于10-15 s)形成的孔的轮廓和极限径向尺寸。

著录项

  • 来源
    《Inorganic materials》 |2016年第10期|979-984|共6页
  • 作者单位

    Moscow Technol Univ, Inst Fine Chem Technol, Pr Vernadskogo 86, Moscow 119571, Russia;

    Moscow Technol Univ, Inst Fine Chem Technol, Pr Vernadskogo 86, Moscow 119571, Russia;

    Moscow Technol Univ, Inst Fine Chem Technol, Pr Vernadskogo 86, Moscow 119571, Russia;

    Moscow Technol Univ, Inst Fine Chem Technol, Pr Vernadskogo 86, Moscow 119571, Russia;

    Moscow Technol Univ, Inst Fine Chem Technol, Pr Vernadskogo 86, Moscow 119571, Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    porous silicon; pore size; pore contours; mathematical model;

    机译:多孔硅;孔径;孔径轮廓;数学模型;

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