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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Ray representation of longitudinal lateral waves in acoustic microscopy
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Ray representation of longitudinal lateral waves in acoustic microscopy

机译:声学显微镜中纵向侧波的射线表示

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For object materials having a large enough Rayleigh velocity, the V(z) (where V is the output voltage and z is the defocus distance) variation is mainly due to interference between the fields of the geometrically reflected wave and the leaky Rayleigh wave. However, for materials, such as organic compounds, having a low Rayleigh velocity, the leaky Rayleigh wave is not excited. For this case, the lateral wave resulting from propagation along the surface of the longitudinal wave plays a significant role in determining the V(z) dependence. The effect of the lateral wave contribution on V(z) is studied. Ray optics is to derive an expression giving the influence of the longitudinal lateral wave. Good agreement is found between the theory and measurements for z not near zero. Because of the ease with which the longitudinal wave velocity can be obtained from V(z), one can conveniently determine the elastic constant c/sub 11/ of isotropic materials using the acoustic microscope.
机译:对于具有足够大的瑞利速度的目标材料,V(z)(其中V为输出电压,z为散焦距离)变化主要是由于几何反射波场与泄漏瑞利波场之间的干扰所致。但是,对于瑞利速度较低的材料,例如有机化合物,不会激发泄漏的瑞利波。对于这种情况,由沿纵波表面传播产生的横波在确定V(z)依赖性方面起着重要作用。研究了侧波对V(z)的影响。射线光学器件将得出一个表达式,该表达式给出纵向侧波的影响。在理论值与z的测量值之间发现了很好的一致性,但不接近零。由于可以很容易地从V(z)获得纵向波速,因此可以使用声学显微镜方便地确定各向同性材料的弹性常数c / sub 11 /。

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