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Acoustic microscopy measurement of elastic constants and massdensity

机译:声学显微镜测量弹性常数和密度

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A method is presented to determine the elastic constants and thenmass density of isotropic and anisotropic solids and anisotropic thinnfilms. The velocity and attenuation of leaky surface acoustic wavesn(SAWs) have been obtained for specified propagation directions from V(z)ncurves measured by line-focus acoustic microscopy (LFAM). Thenexperimentally obtained velocities have been compared to velocitiesnobtained from a measurement model for the V(z) curve which simulates thenexperiment. Since the measured and simulated V(z) curves have the samensystemic errors, the material constants are free of such errors. For annisotropic solid, Young's modulus E, the shear modulus G and the massndensity Ρ have been determined from the leaky Rayleigh wave velocitynand attenuation, measured by LFAM, and a longitudinal wave velocitynmeasured by a pulse-echo transit-time technique. For a cubic-crystallinensolid, the ratios of the elastic constants to the mass density (c11n/Ρ, c12/Ρ, c44/Ρ) have beenndetermined from the directional variation of measured SAW velocities,nusing a preliminary estimate of Ρ. The mass density Ρ hasnsubsequently been determined by additionally using the attenuation ofnleaky SAWs in crystal symmetry directions. For a cubic-crystalline thinnfilm deposited on a substrate, the elastic constants and the massndensity (c11, c12, c44, Ρ) of thenfilm have been determined from the directional variation of the measurednSAW velocities, and a comparison of the corresponding attenuationncoefficient with the measured attenuation coefficient has been used tonverify the results
机译:提出了一种确定各向同性和各向异性固体以及各向异性薄膜的弹性常数和质量密度的方法。对于特定的传播方向,已通过线聚焦声显微镜(LFAM)测量的V(z)n曲线获得了泄漏声表面波的速度和衰减。然后将实验获得的速度与从模拟实验的V(z)曲线的测量模型获得的速度进行比较。由于测量和模拟的V(z)曲线具有相同的系统误差,因此材料常数中没有此类误差。对于各向异性的固体,杨氏模量E,剪切模量G和质量密度P由泄漏的瑞利波速度n和衰减(通过LFAM测量)和纵向波速度n(通过脉​​冲回波传播时间技术)确定。对于立方晶状固体,已经使用P的初步估计值从测量的SAW速度的方向变化确定了弹性常数与质量密度的比值(c11n / P,c12 / P,c44 / P)。随后,通过另外使用晶体对称方向上的弱声表面声波的衰减来确定质量密度P。对于沉积在基板上的立方晶体薄膜,已经根据测得的nSAW速度的方向变化以及相应的衰减系数与测得的比较确定了薄膜的弹性常数和质量密度(c11,c12,c44,Ρ)已使用衰减系数来验证结果

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